Malaviya National Institute of Technology Jaipur

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An Accelerated Degradation Test Planning Using Inverse Gaussian Process For Reliability Prediction...

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dc.contributor.author Nafees, Areesha
dc.date.accessioned 2017-07-10T05:24:03Z
dc.date.available 2017-07-10T05:24:03Z
dc.date.issued 2015-06-01
dc.identifier.govdoc 2013PIE5141
dc.identifier.uri http://hdl.handle.net/123456789/270
dc.language.iso en en_US
dc.publisher MNIT Jaipur en_US
dc.title An Accelerated Degradation Test Planning Using Inverse Gaussian Process For Reliability Prediction... en_US
dc.type Thesis en_US
dc.contributor.guide Professor, Prof. Rakesh Jain


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