Please use this identifier to cite or link to this item: http://idr.mnit.ac.in/jspui/handle/123456789/270
Title: An Accelerated Degradation Test Planning Using Inverse Gaussian Process For Reliability Prediction...
Authors: Nafees, Areesha
Professor, Prof. Rakesh Jain
Issue Date: 1-Jun-2015
Publisher: MNIT Jaipur
Gov't Doc #: 2013PIE5141
URI: http://hdl.handle.net/123456789/270
Appears in Collections:An Accelerated Degradation Test Planning Using Inverse Gaussian Process For Reliability Prediction...

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