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http://idr.mnit.ac.in/jspui/handle/123456789/270
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Nafees, Areesha | - |
dc.date.accessioned | 2017-07-10T05:24:03Z | - |
dc.date.available | 2017-07-10T05:24:03Z | - |
dc.date.issued | 2015-06-01 | - |
dc.identifier.govdoc | 2013PIE5141 | - |
dc.identifier.uri | http://hdl.handle.net/123456789/270 | - |
dc.language.iso | en | en_US |
dc.publisher | MNIT Jaipur | en_US |
dc.title | An Accelerated Degradation Test Planning Using Inverse Gaussian Process For Reliability Prediction... | en_US |
dc.type | Thesis | en_US |
dc.contributor.guide | Professor, Prof. Rakesh Jain | - |
Appears in Collections: | An Accelerated Degradation Test Planning Using Inverse Gaussian Process For Reliability Prediction... |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
2013PIE5141-Areesha Nafees.pdf | 2013PIE5141-Areesha Nafees | 231.68 kB | Adobe PDF | View/Open |
2013PIE5141-Areesha Nafees.pdf | 2013PIE5141-Areesha Nafees | 353.15 kB | Adobe PDF | View/Open |
2013PIE5141-Areesha Nafees.pdf | 2013PIE5141-Areesha Nafees | 1.22 MB | Adobe PDF | View/Open |
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