Please use this identifier to cite or link to this item:
http://idr.mnit.ac.in/jspui/handle/123456789/270
Title: | An Accelerated Degradation Test Planning Using Inverse Gaussian Process For Reliability Prediction... |
Authors: | Nafees, Areesha Professor, Prof. Rakesh Jain |
Issue Date: | 1-Jun-2015 |
Publisher: | MNIT Jaipur |
Gov't Doc #: | 2013PIE5141 |
URI: | http://hdl.handle.net/123456789/270 |
Appears in Collections: | An Accelerated Degradation Test Planning Using Inverse Gaussian Process For Reliability Prediction... |
Files in This Item:
File | Description | Size | Format | |
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2013PIE5141-Areesha Nafees.pdf | 2013PIE5141-Areesha Nafees | 231.68 kB | Adobe PDF | View/Open |
2013PIE5141-Areesha Nafees.pdf | 2013PIE5141-Areesha Nafees | 353.15 kB | Adobe PDF | View/Open |
2013PIE5141-Areesha Nafees.pdf | 2013PIE5141-Areesha Nafees | 1.22 MB | Adobe PDF | View/Open |
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