Please use this identifier to cite or link to this item: http://idr.mnit.ac.in/jspui/handle/123456789/270
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dc.contributor.authorNafees, Areesha-
dc.date.accessioned2017-07-10T05:24:03Z-
dc.date.available2017-07-10T05:24:03Z-
dc.date.issued2015-06-01-
dc.identifier.govdoc2013PIE5141-
dc.identifier.urihttp://hdl.handle.net/123456789/270-
dc.language.isoenen_US
dc.publisherMNIT Jaipuren_US
dc.titleAn Accelerated Degradation Test Planning Using Inverse Gaussian Process For Reliability Prediction...en_US
dc.typeThesisen_US
dc.contributor.guideProfessor, Prof. Rakesh Jain-
Appears in Collections:An Accelerated Degradation Test Planning Using Inverse Gaussian Process For Reliability Prediction...

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